High-Resolution Electron-Microscopic Images (HREM) and Electron-Diffraction Patterns (EDP) are strong tools for researching matter structures.
高分辨电子显微图(HREM)和电子衍射图(EDP)是研究物质结构的强有力工具,只有利用计算机才能对HREM和EDP进行有效的分析、处理。
Based on wavelet analysis, a kind of method is brought forward to improve the diffraction image processing precision of viscose filament diameter.
本文提出一种利用小波平滑去噪,改善粘胶长丝衍射图像处理精度的方法。
This paper gives a solution to define the diffusion state of diffraction images edge, and presents two mathematical methods to calculate inspection results.
针对衍射图像边缘弥散状态不易切准的问题，运用光电积分的方法确定采集点，然后将二值化的数据通过计算机采用最小二乘法进行计算，从而保证了测量结果的正确
Showing diffraction patterns by six-angular set-spectacle prism;
采用六棱嵌镜分光器全视域显现衍射图样
Defects inspection of optical,surface by recognizing laser diffraction patterns;
激光衍射图样识别法检验光学零件表面疵病
By analyzing the symmetry and denseness of the phasor distribution arranged in a sector region,we can easily determine the condition under which the principal maximum,the subsidiary maximum or the minimum of a Fraunhofer diffraction pattern occurs.
介绍了一种解释夫朗和费衍射现象的矢量图示方法———相子扇形图示 ,通过分析矢量扇形分布的对称性和密集性 ,简单直观地说明了夫朗和费衍射图样主极大、次极大及极小的存在条件 ,同时根据矢量图示简化了强度分布公式的推导过程 ,并在图中找到公式中每个参量的确定几何意