Crystallization process of CoSi2 thin films prepared by radio frequency magnetron sputtering have been investigated by in situ X-ray diffraction.
利用射频磁控溅射方法制备了具有CoSi2成分的非晶薄膜,对非晶薄膜的晶化过程进行了原位X射线分析。
X-ray apparatus for structure analysis
结构分析用x射线分析
energy-dispersive X-ray analysis (EDX)
能量分散x射线分析
non-dispersive X-ray analysis (NDXA)
非分散性X射线分析
portable X-ray analyzer
携带式x射线分析仪
energy dispersion x ray analysis
能量色散x射线分析
wavelength-dispersive X-ray analysis
波长色散x-射线分析
energy-dispersive X-ray analysis
能量色散x-射线分析
neutron-capture gamma-ray analysis (NCGA)
中子俘获γ射线分析
nondispersive X-ray analyzer
非色散x射线分析器
electron probe X-ray analyzer
电子探针x射线分析器
vacuum fluorescence X-ray analyzer
真空荧光x射线分析器
microbeam X-ray analyzer
微束X-射线分析器
ion induced x ray analysis
离子感生x 射线分析
X-ray Diffractive analysis of Crystal Structure ?
X-射线衍射晶体分析
x ray fluorescence spectroscopy
x 射线荧光光谱分析
fluorescent X - ray spectroscopy
荧光x-射线光谱分析
Geiger steel analyzer
盖革x射线钢分析仪
X-ray probe micro-analyzer
x射线探针微量分析仪