In this paper, the grating′s ±1 order diffractive beams of the object′s measured surface are interfered each other by using the micro interference system.
采用显微干涉光路，使被测物体表面光栅的±１级衍射光相互干涉，用显微ＣＣＤ图象采集系统采集干涉后形成的倍增光栅，利用微网格法原理和信息转换技术提取每一幅倍增光栅图象的几何特征，确定被测物体表面的应变。
By using a micro interference system, the surface gratings ±1 order diffractive beams become interfered with each other, and the multiplier grating caused by the interference is recorded by a micro CCD image gathering system.
提出采用显微干涉光路，使被测曲面上光栅的±１ 级衍射光相互干涉，用显微ＣＣＤ图象采集系统采集干涉后形成的倍增光栅，利用微网格法原理和信息转换技术提取每一幅图的几何特征，确定被测物体表面的应变。
Improvement and analysis of measuring thickness using interference microscope;
用干涉显微镜测量薄膜厚度的改进与分析
Curvature measurement of micro cantilever based on phase-stepping microscopic interferometry;
测量微悬臂梁曲率的相移显微干涉法
A Testing System for Optical Fiber Connector End Surface Based on Microscopic Interferometry
光纤连接器端面的显微干涉测试系统
Measuring Dynamic Characterization of Micro-structures with Linnik Microscopic Interferometry
利用Linnik显微干涉技术测量微结构动态特性
Study on the Dynamic Testing Methods and System of MEMS Based on Microscopic Interferometry
基于显微干涉术的微机电系统动态测试方法与系统的研究
Study of Key Techniques of Microscopic Interferometry in Mini-surface Geometry;
显微干涉术在测量微小表面几何参数中的关键技术研究
Linnik Microscopic Interferometry for Measuring the Surface Profile of Microstructures Through Transparent Media
透明介质下微结构表面形貌的Linnik显微干涉测量技术
Study on Out-of Plane Motion in MEMS Using Phase-stepping Microscopic Interferometry and Stroboscopic Imaging Technique;
利用相移显微干涉术和频闪成像技术研究MEMS离面运动
differential interference phasecontrast microscope
微差干涉衬比显微镜
differential interference contrast microscope
微分干涉相差显微镜
differential interference contrast microscopy
差示干涉差显微镜术
Test method for stacking fault density of epitaxial layers of silicon by interference-contrast microscopy
GB/T14145-1993硅外延层堆垛层错密度测定干涉相衬显微镜法
Measuring Method for Topography of DOE Based on Dual-Path Two-Wavelength Phase Shifting Interferometric Microscopy
双光路双波长相移干涉显微法测量衍射光学元件形貌
The Study on Heterodyne Interferometric Microscope for Profiles of Microelectronic Mask Surfaces Measurement;
用于掩模板表面形貌测量的外差干涉显微系统的研究
solar microwave interferometer imaging system
太阳微波干涉成像系统
Of, relating to, or concerned with a microscope.
显微镜的属于，关于或涉及一个显微镜的
Surface microtopography, representation and tracer of microscale vortex dislocation of hydrothermal synthetic sapphires and natural beryls are studied by using atomic force micro-scope and interference microscope.
采用原子力显微镜、干涉显微镜对水热法合成蓝宝石和天然绿柱石等宝石的表面微形貌进行了研究。
of or relating to or involving and electron microscope.
属于、关于或涉及电子显微镜的。
The present section has included only the basic principles of a microscope.
本节只涉及显微镜的一些基本原理。
Evidently diffraction, as well as interference, is a wave property.
显然，衍射以及干涉是波特性。