1.In this study, magnetic domain structures of the semiconductor nanostructures (Ge, Si) were studied by magnetic force microscope (MFM).
本研究是以磁力显微镜观察半导体材料锗、矽之奈米结构的磁区。
2.Study on the effect of oblique sputtering on TbFe thin films by MFM
利用磁力显微镜研究倾斜溅射对TbFe薄膜磁性能的影响